High-precision, miniaturized, substrate-free filters, arising from ion beam sputtering on a sacrificial substrate, were developed by us. Eco-friendly and cost-effective, the sacrificial layer can be dissolved simply by adding water. In comparison to filters from the same coating run, our filters using thin polymer layers show an increased performance. Implementing a single-element coarse wavelength division multiplexing transmitting device for telecommunication applications is possible with these filters, achieved by inserting the filter in between the fiber ends.

Atomic layer deposition (ALD) was used to create zirconia films, subsequently irradiated with 100 keV protons, with fluence levels varying from 1.1 x 10^12 p+/cm^2 to 5.0 x 10^14 p+/cm^2. The presence of a carbon-rich layer, deposited on the optical surface as a result of proton impact, was found to indicate contamination. TPX-0005 mw The critical role of a correct estimation of substrate damage in reliably evaluating the optical constants of the irradiated films has been shown. The ellipsometric angle's sensitivity is evident when encountering both a buried damaged zone in the irradiated substrate and a contamination layer present on the sample's surface. Carbon-doped zirconia's elaborate chemistry, encompassing excess oxygen content, is explored, along with the resultant shifts in the irradiated films' refractive index caused by compositional changes within the film.

Dispersion during both generation and propagation of ultrashort vortex pulses (pulses with helical wavefronts) necessitates compact tools for successful implementation of potential applications. By using a global simulated annealing optimization algorithm based on an examination of temporal characteristics and waveform patterns in femtosecond vortex pulses, this work successfully constructs and optimizes chirped mirrors. Different optimization approaches and chirped mirror designs are employed to showcase the algorithm's performance.

From preceding investigations using stationary scatterometers and white light, we propose, to the best of our understanding, a novel white-light scattering experiment anticipated to yield superior results to the existing methodologies in almost all cases. A spectrometer coupled with a broadband illumination source forms the uncomplicated setup for examining light scattering, targeted to a singular direction. The fundamental principle of the instrument elucidated, roughness spectra are obtained for multiple samples and the consistency of results is examined at the intersection of bandwidths. This technique will be extremely beneficial for samples that are not transportable.

Using the dispersion of a complex refractive index, this paper investigates and proposes a way to analyze how the optical properties of gasochromic materials change when influenced by diluted hydrogen (35% H2 in Ar). Hence, a prototype material comprising a tungsten trioxide thin film and an added platinum catalyst was produced via electron beam evaporation. Experimental confirmation highlights that the proposed approach explicates the causes for the observed variations in transparency within such materials.

For the purpose of integration into inverted perovskite solar cells, a hydrothermal method is utilized in this paper to synthesize a nickel oxide nanostructure (nano-NiO). The hole transport and perovskite layers of the ITO/nano-N i O/C H 3 N H 3 P b I 3/P C B M/A g device benefited from the improved contact and channel connection achieved through the utilization of these pore nanostructures. The research undertaking has a dual purpose. Temperatures of 140°C, 160°C, and 180°C were used in the synthesis process to develop three differing nano-NiO morphologies. Post-annealing at 500°C, a Raman spectrometer was used to scrutinize the phonon vibrational and magnon scattering characteristics. TPX-0005 mw Secondly, nano-nickel oxide powders were dispersed uniformly in isopropanol, preparing them for subsequent spin-coating onto the inverted solar cells. At synthesis temperatures of 140°C, 160°C, and 180°C, the nano-NiO morphologies displayed the forms of multi-layer flakes, microspheres, and particles, respectively. When nano-NiO microspheres served as the hole transport layer, the perovskite layer demonstrated a broader coverage reaching 839%. X-ray diffraction was used to determine the grain size of the perovskite layer, showcasing significant crystallographic orientations in the (110) and (220) planes. However, the impact of power conversion efficiency on the promotion is substantial, reaching 137 times greater than the planar structure's poly(34-ethylenedioxythiophene) polystyrene sulfonate conversion efficiency.

Alignment of both the substrate and the optical path is essential for accurate broadband transmittance measurements used in optical monitoring. We propose a correction process for improved monitoring accuracy, even in the presence of substrate features like absorption or discrepancies in the optical path. The substrate, in this case, can be selected as a test glass or a product. Using experimental coatings, with and without the correction factor, the algorithm is experimentally proven. The optical monitoring system was also deployed for in situ quality control. The system facilitates a high-resolution, detailed spectral analysis of all substrates. Identification of plasma and temperature's influence on the central wavelength of a filter has been made. This insight fosters the refinement of future performance metrics.

To obtain the most accurate wavefront distortion (WFD) measurement, an optical filter-coated surface needs evaluation at the filter's operating wavelength and angle of incidence. While not always possible, the filter's evaluation necessitates measurement at a wavelength and angle outside of its nominal range (typically 633 nanometers and 0 degrees, respectively). Since transmitted wavefront error (TWE) and reflected wavefront error (RWE) are contingent upon the measurement wavelength and angle, an out-of-band measurement might not provide an accurate description of the wavefront distortion (WFD). Our investigation in this paper outlines the process for determining the wavefront error (WFE) characteristics of an optical filter within its passband at varying angles, leveraging WFE measurements taken at different wavelengths and angles outside the passband. This method relies on the optical coating's theoretical phase properties, measured filter thickness uniformity, and the substrate's wavefront error sensitivity to the angle of incidence. The RWE measured directly at a wavelength of 1050 nanometers (45) showed a reasonably good correlation with the predicted RWE derived from a measurement at 660 nanometers (0). A series of TWE measurements, using LEDs and lasers, demonstrates that measuring the TWE of a narrow bandpass filter (11 nm bandwidth, centered at 1050 nm) with a broad-spectrum LED source can result in wavefront distortion being significantly affected by the chromatic aberration of the measurement apparatus. Consequently, a light source with a narrower bandwidth than the filter is preferable.

The laser's damaging effect on the final optical components of high-power laser systems ultimately determines the limit of their peak power. The component's durability is inversely proportional to the damage growth occurring at the site of damage generation. To increase the laser-induced damage threshold of these components, a great deal of research has been undertaken. Could raising the initiation threshold bring about a decrease in the extent of damage growth? We performed experiments monitoring damage evolution on three separate multilayer dielectric mirror designs, each exhibiting a different level of damage susceptibility. TPX-0005 mw Utilizing optimized designs in conjunction with classical quarter-wave structures was our strategy. Experiments were conducted using a spatial top-hat beam, spectrally centered at 1053 nanometers, with a pulse duration of 8 picoseconds and employing both s- and p-polarizations. The outcomes highlighted the impact of design on the enhancement of damage growth thresholds and a decrease in the rates of damage progression. Simulation of damage growth sequences was achieved through the application of a numerical model. The results demonstrate a resemblance to the experimentally observed patterns. These three cases support the conclusion that an improved initiation threshold, achievable through modifications in the mirror's design, can contribute to a reduction in the damage growth rate.

Optical thin films, containing contaminating particles, can experience nodule creation and a decrease in their laser-induced damage threshold (LIDT). An investigation into the viability of substrate ion etching for diminishing the influence of nanoparticles is presented in this work. Early studies hint that ion etching may be effective in removing nanoparticles from the sample surface; nevertheless, this method inevitably produces substrate surface texturing. Despite LIDT measurements showing no noteworthy decrease in substrate resilience, this texturing process contributes to a rise in optical scattering loss.

For superior optical system performance, an effective antireflection coating is crucial to reduce reflectance and increase transmittance at optical interfaces. Light scattering, a consequence of fogging, is a further problem that negatively affects image quality. Therefore, complementary functional properties must be incorporated. In a commercial plasma-ion-assisted coating chamber, a highly promising combination was generated; a long-term stable antifog coating is coupled with an antireflective double nanostructure. The antifogging characteristics of materials are unaffected by the presence of nanostructures, thus allowing for diverse applications.

At his residence in Tucson, Arizona, Professor Hugh Angus Macleod, known as Angus to his cherished family and friends, passed away on April 29th, 2021. Angus's pioneering work in thin film optics, a field in which he was a leading authority, has left an extraordinary legacy for the thin film community. Over 60 years, Angus's career in optics is the subject of this article's examination.